Probe cards

Synergie Cad

Probe and Test

Cantilever Probe Cards

Epoxy: Mainstream Applications and fine pitch down to 44 μm. Multi-die Testing. Fine pitch Shelf cards.
Blade: Hybrid devices testing, special applications.
Parametric Technology: Parametric testing, low leakage and ultra-low leakage down to 1 FemtoAmp/Volt for Keithley/Agilent and others.

International Test Solutions cleaning solutions are used by semiconductor manufacturers to remove debris and contaminants generated during semiconductor device manufacturing, wafer level testing, and final package test
Cantilever Probe Cards

Address:

SiSTEM Technology Limited
Grafton Suite, 
Caswell Science & Technology Park
Towcester, 
Northamptonshire, 
NN12 8EQ , UK

Email:
sales@sistemtechnology.com

Telephone:
+44 1327 317621

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